Title:
METHOD AND APPARATUS FOR TESTING MULTIPLE-IC DEVICE
Document Type and Number:
Japanese Patent JP2017194483
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a method and an apparatus for testing a multiple-IC device.SOLUTION: An integrated circuit includes; a first input interconnect to receive an input signal; a first test-enable interconnect to receive a test enable signal; a controller for performing testing of the integrated circuit on the basis of values corresponding to the input signal; an input port; and a first multiplexer coupled to the first input interconnect, the controller, and the input port. The multiplexer is controllable to pass the input signal to the input port in response to non-assertion of the test enable signal, and to pass the input signal to the controller in response to assertion of the test enable signal.SELECTED DRAWING: Figure 3
Inventors:
MICHAEL E STANLEY
JOSEPH S VACCARO
JOSEPH S VACCARO
Application Number:
JP2017133640A
Publication Date:
October 26, 2017
Filing Date:
July 07, 2017
Export Citation:
Assignee:
NXP USA INC
International Classes:
G01R31/28; H01L21/822; H01L27/04
Attorney, Agent or Firm:
Atsushi Honda