Title:
A method in relation to a stable chemical mechanical polish constituent and it which can be condensed
Document Type and Number:
Japanese Patent JP6118502
Kind Code:
B2
Abstract:
A chemical mechanical polishing composition useful for chemical mechanical polishing a semiconductor wafer containing an interconnect metal is provided, comprising, as initial components: water; an azole inhibitor; an alkali metal organic surfactant; a hydrotrope; a phosphorus containing agent; a water soluble cellulose; optionally, a non-saccharide water soluble polymer; optionally, a water soluble acid compound of formula I, wherein R is selected from a hydrogen and a C1-5 alkyl group, and wherein x is 1 or 2; optionally, a complexing agent; optionally, an oxidizer; optionally, an organic solvent; and, optionally, an abrasive. Also, provided is a method of preparing a chemical mechanical polishing composition of the present invention and a method for chemical mechanical polishing of a substrate, comprising: providing a substrate, wherein the substrate is a semiconductor wafer having copper interconnects; providing a chemical mechanical polishing composition of the present invention; providing a chemical mechanical polishing pad; creating dynamic contact at an interface between the chemical mechanical polishing pad and the substrate with a down force of 0.69 to 34.5 kPa; and, dispensing the chemical mechanical polishing composition onto the chemical mechanical polishing pad at or near the interface between the chemical mechanical polishing pad and the substrate; wherein the chemical mechanical polishing composition exhibits a pH adjusted to a pH of 2 to 6 through the addition of at least one of phosphoric acid, magnesium hydroxide and lithium hydroxide.
Inventors:
Hamed Laclaw
Jinjie C
Joseph Letizia
Shu Li
Thomas H. Calanter
Francis kelly
Jay Keith Harris
Christopher Jay Tucker
Jinjie C
Joseph Letizia
Shu Li
Thomas H. Calanter
Francis kelly
Jay Keith Harris
Christopher Jay Tucker
Application Number:
JP2012046433A
Publication Date:
April 19, 2017
Filing Date:
March 02, 2012
Export Citation:
Assignee:
Rohm and Haas Electronic Materials CMP Housings, Inc.
Dow Global Technologies LLC
Dow Global Technologies LLC
International Classes:
H01L21/304; B24B37/00; C09K3/14
Domestic Patent References:
JP2009256184A | ||||
JP200177063A | ||||
JP200891411A | ||||
JP2005347579A |
Attorney, Agent or Firm:
Patent business corporation Tsukuni
Hajime Tsukuni
Yasuo Yanagibashi
Hidemi Kawada
Masatoshi Ando
Sugimoto Shoichi
Kurino Yuriko
Fusayuki Saito
Hajime Tsukuni
Yasuo Yanagibashi
Hidemi Kawada
Masatoshi Ando
Sugimoto Shoichi
Kurino Yuriko
Fusayuki Saito
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