Title:
A microscope imaging device, a microscope imaging method, and a microscope imaging program
Document Type and Number:
Japanese Patent JP6246555
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a device, method, and program for capturing microscopic images, which enable users to recognize it when light reception signal strength is saturated.SOLUTION: Measurement light having a predetermined pattern is produced by a pattern imparting unit 110 and is irradiated on an object S under measurement. A spatial phase of the produced pattern is sequentially shifted on the object S under measurement by predetermined increments by the pattern imparting unit 110. A light receiving unit 120 receives light from the object S under measurement and outputs a light reception signal that represents received light intensity. Based on a plurality of sets of patterned image data generated at a plurality of phases of the pattern using the light reception signal, sectioning image data representing an image of the object S under measurement is generated. Assessment is made as to whether the light reception signal is saturated or not based on at least one of the plurality of sets of patterned image data. A user is notified if the light reception signal is saturated.
Inventors:
Yasunori
Takeshi Kataoka
Takeshi Kataoka
Application Number:
JP2013222722A
Publication Date:
December 13, 2017
Filing Date:
October 25, 2013
Export Citation:
Assignee:
Keyence Corporation
International Classes:
G02B21/36; H04N5/225
Domestic Patent References:
| JP2001117010A | ||||
| JP2004145153A | ||||
| JP2010250102A | ||||
| JP9297269A | ||||
| JP690906A | ||||
| JP2008129226A | ||||
| JP200947460A | ||||
| JP2012155010A |
Foreign References:
| WO2001067155A1 |
Attorney, Agent or Firm:
Yoshito Fukushima