Title:
The multiplex sampling CMOS sensor for X diffraction measurement which amends a nonideal sensor action
Document Type and Number:
Japanese Patent JP6084231
Kind Code:
B2
Abstract:
Readout noise for each pixel in a CMOS Active Pixel Sensor is reduced by a five step process in which the pixel charge data from the sensor is non-destructively sampled at a plurality of times during a sensor frame time period and corrected for gain variation and nonlinearity. Then fixed pattern and dark current noise is estimated and subtracted from the corrected pixel charge data. Next, reset noise is estimated and subtracted from the pixel charge data. In step four, a model function of charge versus time is fit to the corrected pixel charge data samples. Finally, the fitted model function is evaluated at frame boundary times.
Inventors:
Roger D. Durst
Gregory A. Wechter
George Karcher
Gregory A. Wechter
George Karcher
Application Number:
JP2014540010A
Publication Date:
February 22, 2017
Filing Date:
October 30, 2012
Export Citation:
Assignee:
Bruker AXS, Inc.
International Classes:
G01N23/207
Domestic Patent References:
| JP7171142A | ||||
| JP7275235A | ||||
| JP2004112077A | ||||
| JP2010082254A | ||||
| JP2011101359A | ||||
| JP2010245891A |
Attorney, Agent or Firm:
Patent Business Corporation Tani/Abe Patent Office
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