Title:
ELECTRONIC DEVICE NETWORK, ELECTRONIC DEVICE AND INSPECTION PROCESS THEREOF
Document Type and Number:
Japanese Patent JP2018011299
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide chip authentication unable to be physically duplicated, by taking advantage of physical randomness of an authentication element group produced integrally with manufacture of semiconductor chips, as a unique physical address of a network node having physical reality.SOLUTION: In an electronic device network, electronic devices which make up the network are separated into two types of nodes, namely, a peripheral node and a core node managing registration information of the peripheral node. The core node performs central management and the peripheral node is mounted with a chip authentication device which cannot be physically duplicated. By managing a physical address of the peripheral node at a chip level, the electronic device network enables management and security of the entire network to be efficiently improved.SELECTED DRAWING: Figure 88
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Inventors:
WATANABE HIROSHI
TSENG TE-CHANG
NAGAI TAKAHIRO
SHIRATA RIICHIRO
TSENG TE-CHANG
NAGAI TAKAHIRO
SHIRATA RIICHIRO
Application Number:
JP2017134161A
Publication Date:
January 18, 2018
Filing Date:
July 07, 2017
Export Citation:
Assignee:
WATANABE HIROSHI
International Classes:
H04L12/28
Domestic Patent References:
JP2015139010A | 2015-07-30 | |||
JP2003512698A | 2003-04-02 | |||
JP2012043517A | 2012-03-01 | |||
JP2015026408A | 2015-02-05 | |||
JP2012073954A | 2012-04-12 | |||
JP2016105585A | 2016-06-09 | |||
JP2017169049A | 2017-09-21 |
Foreign References:
US20140091832A1 | 2014-04-03 |
Attorney, Agent or Firm:
Sumiko Shimosaka
Yusuke Uchikoshi
Yusuke Uchikoshi