Title:
An optical phase measuring method, an optical phase measuring device, and an optical communication device
Document Type and Number:
Japanese Patent JP6202499
Kind Code:
B2
Abstract:
The present invention relates to an optical phase measuring method and an optical phase measuring device which can measure phase information contained in an object beam with high accuracy. Intensity distributions of a test object beam, a first reference beam and a first hologram made from the object beam and the first reference beam are detected by the first light intensity detection section. Intensity distributions of the test object beam, a second reference beam and a second hologram made from the object beam and the second reference beam are detected in the second light intensity detection section. Phase information contained in the object beam is computed on the basis of the intensity distributions detected in the first light intensity detection section and the intensity distributions detected in the second light intensity detection section.
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Inventors:
Atsushi Okamoto
Nozawa Hitoshi
Yuta Wakayama
Nozawa Hitoshi
Yuta Wakayama
Application Number:
JP2014538203A
Publication Date:
September 27, 2017
Filing Date:
September 27, 2013
Export Citation:
Assignee:
National University Corporation Hokkaido University
International Classes:
G01B9/02; G01J9/02; G03H1/10; H04B10/2507; H04B10/2581
Domestic Patent References:
| JP2000329514A | ||||
| JP11194011A | ||||
| JP2008185582A | ||||
| JP614324A |
Foreign References:
| US7643157 | ||||
| US7609388 |
Attorney, Agent or Firm:
Koichi Washida