Title:
絶対的な位置設定をするための位置測定装置
Document Type and Number:
Japanese Patent JP4620330
Kind Code:
B2
Abstract:
The position measuring device has a scanning unit (AE) for scanning a sequential pseudo-random code (C) having a series of code elements (C1,C2,C3) extending in the measuring direction (X), each having 2 complementary partial regions. The binary information (B1,B2,B3) for each code element is obtained by comparing scanned signals for both partial regions. An Independent claim for an absolute position measuring method is also included.
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Inventors:
Elmar Meyer
Ulrich Benner
Ulrich Benner
Application Number:
JP2003002452A
Publication Date:
January 26, 2011
Filing Date:
January 08, 2003
Export Citation:
Assignee:
DR. JOHANNES HEIDENHAIN GESELLSCHAFT MIT BESCHRANKTER HAFTUNG
International Classes:
G01D5/347; G01D5/249; G01D5/36; H03M1/06; H03M5/12; H03M1/28
Domestic Patent References:
| JP4346029A | ||||
| JP7167675A | ||||
| JP200018971A | ||||
| JP200182984A |
Attorney, Agent or Firm:
Mitsufumi Esaki
Tsuneo Mihara
Blacksmith
Tsuneo Mihara
Blacksmith