Title:
A preparation method of the slit used for a high resolution spectrum pickup system
Document Type and Number:
Japanese Patent JP5919349
Kind Code:
B2
Abstract:
A monolithic Offner spectrometer is described herein as are various components like a diffraction grating and a slit all of which are manufactured by using a state-of-the-art diamond machining process. In one embodiment, a monolithic Offner spectrometer is directly manufactured by using a diamond machining process. In another embodiment, a monolithic Offner spectrometer is manufactured by using molds which are made by a diamond machining process. In yet another embodiment, a diffraction grating is directly manufactured by using a diamond machining process. In still yet another embodiment, a diffraction grating is manufactured by using a mold which is made by a diamond machining process. In yet another embodiment, a slit is directly manufactured by using a diamond machining process.
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Inventors:
Lovell E Second Comstock
Application Number:
JP2014188642A
Publication Date:
May 18, 2016
Filing Date:
September 17, 2014
Export Citation:
Assignee:
CORNING INCORPORATED
International Classes:
B23B1/00; B23B5/00; B23C3/28; G02B5/18
Domestic Patent References:
| JP2002346803A | ||||
| JP10328922A | ||||
| JP2000210808A |
Foreign References:
| US5618217 |
Attorney, Agent or Firm:
Yanagita Seiji
Go Sakuma
Go Sakuma