Title:
通電試験用プローブ及びプローブ組立体
Document Type and Number:
Japanese Patent JP5631131
Kind Code:
B2
Abstract:
An embodiment disperses a force acting on a border portion between an extending portion and a pedestal portion or a reinforcing member to prevent breakage of a probe tip portion of a probe. An electrical test probe includes a probe main body, a recess provided at an end of the main body and having an inner surface, and a probe tip having a part received in the recess. The inner surface has a central area and two lateral areas on both sides of the central area, and the part of the probe tip is located at the central area and at least at either one of the lateral areas.
Inventors:
林崎 孝幸
相馬 亮
平川 秀樹
相馬 亮
平川 秀樹
Application Number:
JP2010208822A
Publication Date:
November 26, 2014
Filing Date:
September 17, 2010
Export Citation:
Assignee:
株式会社日本マイクロニクス
International Classes:
G01R1/067; H01L21/66
Attorney, Agent or Firm:
Hidekazu Miyoshi
Masakazu Ito
Nobuyuki Matsunaga
Hidehiko Nakamura
Masakazu Ito
Nobuyuki Matsunaga
Hidehiko Nakamura