Title:
PROBE AND VOLTAGE MEASUREMENT DEVICE USING THE PROBE
Document Type and Number:
Japanese Patent JP2016223818
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a probe capable of further reducing errors of measuring a target voltage and a voltage measurement device using the probe.SOLUTION: A probe 100 includes electrodes 2 of a first electrode 2A, a second electrode 2B, a third electrode 2C, and a fourth electrode 2D, which are electrically insulated from each other. The first electrode 2A is connected to a first capacitor 3A with a known capacitance value, and the second electrode 2B is connected to a second capacitor 3B with a known capacitance value. The third electrode 2C has the same potential as the first electrode 2A has, and the fourth electrode 2D has the same potential as the second electrode 2B has. The third and fourth electrodes 2C and 2D are arranged between the first and second electrodes 2A and 2B. The third electrode 2C is arranged next to the first electrode 2A, and the fourth electrode 2D is arranged next to the second electrode 2B.SELECTED DRAWING: Figure 1
Inventors:
NOSAKA KENICHIRO
Application Number:
JP2015107996A
Publication Date:
December 28, 2016
Filing Date:
May 27, 2015
Export Citation:
Assignee:
PANASONIC IP MAN CORP
International Classes:
G01R19/00; G01R15/16
Attorney, Agent or Firm:
Keisei Nishikawa
Takeshi Sakaguchi
Hidetoshi Kitade
Nakaishi Haruki
Takeshi Sakaguchi
Hidetoshi Kitade
Nakaishi Haruki