Title:
PROCESS CONDITION CORRECTION DEVICE AND CORRECTION METHOD
Document Type and Number:
Japanese Patent JP2018097411
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a process condition correction device capable of reducing performance variations of a product even with variations in a part and material.SOLUTION: A process condition correction device comprises an input inspection reference value storage unit, an input inspection value acquisition unit, a difference calculation unit, a process standard condition storage unit, a process condition correction product performance prediction unit, and a proper correction value determination unit. The input inspection reference value storage unit stores an input inspection reference value of a part and material inputted into a process for producing products. The difference calculation unit calculates a difference between the input inspection value of the part and material acquired by the input inspection value acquisition unit and an input inspection reference value. The process condition correction product performance prediction unit predicts performance of a product, in a case where the inputted part and material has the difference calculated by the difference calculation unit, and a process standard condition stored in the process standard condition storage unit is corrected. The proper correction determination unit determines proper correction, on the basis of predicted performance of the product, so that product performance satisfies a prescribed standard.SELECTED DRAWING: Figure 1
Inventors:
URATA ATSUO
Application Number:
JP2016238404A
Publication Date:
June 21, 2018
Filing Date:
December 08, 2016
Export Citation:
Assignee:
NEC CORP
International Classes:
G06Q50/04; G05B19/418; G06Q10/04
Domestic Patent References:
| JPH0473435A | 1992-03-09 | |||
| JP2004039873A | 2004-02-05 | |||
| JP2004361253A | 2004-12-24 |
Attorney, Agent or Firm:
Masahiko Desk
Naoki Shimosaka
Naoki Shimosaka