Title:
A production method of a shutter time lag measuring method, the display for shutter time lag measurement, and a camera
Document Type and Number:
Japanese Patent JP5994555
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To facilitate measurement of a shutter time lag of a camera.SOLUTION: In a display section having i display elements, when j display elements are caused to be in a first display state and (i-j) display elements are caused to be in a second display state which is darker than the first display state, the i display elements are caused to be a m-th display pattern. After a pattern continuation time Thas elapsed, in the m-th display pattern, k display elements in the j display elements in the first display state are caused to be in the second display state, and in the m-th display pattern, k display elements in (i-j) display elements which are in the second display state are caused to be in the first display state. Thus, a switching operation is sequentially executed to switch i display elements into a (m+1)-th display pattern. The camera takes images of the display section which is in execution of the switching operation in accordance with a shutter operation made on the camera synchronously with the switching operation. Thus, a shutter time lag is calculated based on the images taken by the camera.
Inventors:
Ryuichi Shiobara
Application Number:
JP2012226674A
Publication Date:
September 21, 2016
Filing Date:
October 12, 2012
Export Citation:
Assignee:
Seiko Epson Corporation
International Classes:
G03B15/00; G03B7/091; G03B17/38; H04N5/222; H04N5/225
Domestic Patent References:
| JP2010206520A | ||||
| JP2002290979A |
Foreign References:
| US20080002029 |
Attorney, Agent or Firm:
Mikio Suzuno
Kazuaki Watanabe
Kazuaki Watanabe
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