Title:
A quantitative evaluation method of a conductive material surfacing study state
Document Type and Number:
Japanese Patent JP5966222
Kind Code:
B2
Inventors:
Hiroyuki Nii
Shunsuke Noguchi
Nakagawa Hamazo
Shunsuke Noguchi
Nakagawa Hamazo
Application Number:
JP2011251798A
Publication Date:
August 10, 2016
Filing Date:
November 17, 2011
Export Citation:
Assignee:
Ube Scientific Analysis Center Co., Ltd.
International Classes:
G01N23/227
Domestic Patent References:
| JP2004138508A | ||||
| JP2003301243A | ||||
| JP5119001A | ||||
| JP1021343A |
Foreign References:
| US20040135081 |
Other References:
小島勇夫,外,非対称ガウス-ローレンツ複合関数によるX線光電子分光スペクトルの波形解析,分析化学 ,1986年10月,Vol.35,No.10,P.T96-T100
Attorney, Agent or Firm:
Masaru Itami
Kazuya Chikatsu
Kazuya Chikatsu
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