Title:
A sample analysis device and the sample analysis method
Document Type and Number:
Japanese Patent JP6027838
Kind Code:
B2
Inventors:
Koji Kurono
Yasuhiro Takeuchi
Yasuhiro Takeuchi
Application Number:
JP2012214553A
Publication Date:
November 16, 2016
Filing Date:
September 27, 2012
Export Citation:
Assignee:
Sysmex Corporation
International Classes:
G01N35/00; G01N33/49; G01N35/02; G01N35/04
Domestic Patent References:
| JP5232123A | ||||
| JP2002082118A |