MEASUREMENT DEVICE, MEASUREMENT METHOD, PROGRAM, AND COMPUTER READABLE STORAGE MEDIUM

Japanese Patent JP2016197055

A

PROBLEM TO BE SOLVED: To provide a mechanism with which it is possible to measure a wave height in the shape change of a conductor with high accuracy even when the shape change of the conductor that is an object to be measured is not ignorable as compared with the expanse of a magnetic flux created by the coil of an eddy current type distance meter.SOLUTION: A measurement device according to the present invention comprises: a distance calculation part 144 for calculating, from inductance acquired by a node inductance acquisition part 143, the distance from a third coil 113 arranged at the upward position of a node 213 to the node 213 using a distance calibration curve stored in a distance calibration curve storage part 141; a wave height calibration curve acquisition part 145 for acquiring a wave height calibration curve that corresponds to the distance calculated by the distance calculation part 144 from among wave height calibration curves stored in a wave height calibration curve storage part 142; and a wave height calculation part 149 for calculating, from a difference in coil inductance at crest and trough calculated by an inductance difference calculation part 148, a wave height WH using the wave height calibration curve acquired by the wave height calibration curve acquisition part 145.SELECTED DRAWING: Figure 1

HASHIGUCHI SHOHEI

JP2015076925A

November 24, 2016

April 03, 2015

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NIPPON STEEL & SUMITOMO METAL CORP

G01B7/287; B22D11/16

JP2005121506A	2005-05-12
JP2002197504A	2002-07-12
JP2010164431A	2010-07-29

Takayoshi Kokubun

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