Title:
A supervising system, a foreign substance in an airfield, a fragment, or a method of detecting damage
Document Type and Number:
Japanese Patent JP6110316
Kind Code:
B2
Abstract:
A surveillance system and method for detecting a foreign object, debris, or damage in an airfield, the surveillance system comprising: one or more cameras for capturing images of the airfield; a processing unit for detecting the foreign object, debris or damage in the airfield from the images captured by the one or more cameras; and a weapons impact surveillance system for detecting weapon impact in the airfield and directing the one or more cameras to capture images in an area of the detected weapon impact.
Inventors:
Chu Kien Mew David
Application Number:
JP2013554422A
Publication Date:
April 05, 2017
Filing Date:
February 21, 2012
Export Citation:
Assignee:
STRATECH SYSTEMS LIMITED
International Classes:
B64F1/36; G08B25/00; G08G5/00; H04N7/18
Domestic Patent References:
| JP2010539740A | ||||
| JP2004009993A | ||||
| JP2000207693A | ||||
| JP2001028745A | ||||
| JP2006018658A | ||||
| JP2010185723A |
Foreign References:
| US20060098843 |
Attorney, Agent or Firm:
Oshima/Nishimura/Miyanaga Trademark Patent Office
Masahiro Nanjo
Masahiro Nanjo
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