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Title:
入力バイアス電流の高感度検出のためのシステム及び方法
Document Type and Number:
Japanese Patent JP5854441
Kind Code:
B2
Abstract:
The invention relates to systems and methods for high-sensitivity detection of input bias current. The invention more particularly relates to platforms and techniques for the calibration and measurement of input bias current in op amps or other devices. In embodiments, the platform can incorporate a servo loop connected to a high-sensitivity test amplifier, such as an instrumentation amplifier. The test amplifier can complete a switchable circuit with the servo loop and detect a calibration input bias current for the test platform, without a production device in place. The device under test can be switched into the servo loop, and the total bias current measured with both the device under test and test amplifier in-circuit. The difference between the measured current with the device inserted and the previously measured calibration current represents the bias current for the subject device, without attaching external meters or requiring reference parts of the production type.

Inventors:
Dale A Heaton
David W. Guidley
Application Number:
JP2013531799A
Publication Date:
February 09, 2016
Filing Date:
September 29, 2011
Export Citation:
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Assignee:
Texas Instruments Japan Ltd.
Texas Instruments Incorporated
International Classes:
G01R31/28
Domestic Patent References:
JP62085877A
JP50124557A
Attorney, Agent or Firm:
Kyozo Katayose