Title:
A temperature measurement device and a method of a heat treatment article
Document Type and Number:
Japanese Patent JP6153466
Kind Code:
B2
Abstract:
A device is provided with a measurement window, which is provided in a heat treat furnace and which permits direct visual observation of a surface to be measured of a heat-treated workpiece, and a temperature sensor, which is provided outside the measurement window and which is capable of carrying out noncontact measurement of the surface temperature of the surface to be measured through the measurement window. The temperature sensor has a measurement wavelength range in which the absorptivity by water is low (e.g., 1.95 μm to 2.5 μm). Further, the measurement window is composed of a window material having a high transmittance in the measurement wavelength range (e.g., germanium).
Inventors:
Kazuhiko Katsumata
Junji Inoue
Takahisa Shimada
Shinya Kudo
Ueda Ami
Junji Inoue
Takahisa Shimada
Shinya Kudo
Ueda Ami
Application Number:
JP2013502334A
Publication Date:
June 28, 2017
Filing Date:
February 27, 2012
Export Citation:
Assignee:
Ihi Co., Ltd.
Ihi Mechanical Systems Co., Ltd.
Ihi Mechanical Systems Co., Ltd.
International Classes:
G01J5/06; C21D1/00; C21D1/667; F27D21/00; G01J5/00
Domestic Patent References:
| JP2010249332A | ||||
| JP63288041A | ||||
| JP2010002150A | ||||
| JP2007171112A | ||||
| JP2001281064A | ||||
| JP61193036A | ||||
| JP2003121352A | ||||
| JP2001124409A | ||||
| JP11235331A |
Attorney, Agent or Firm:
Minoru Hotta
Toshihiro Nomura
Toshihiro Nomura