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Patent Searching and Data


Title:
変成器試験装置
Document Type and Number:
Japanese Patent JP4767907
Kind Code:
B2
Abstract:

To provide a transformer tester for accurately and rapidly measuring an electronic transformer.

This transformer tester is used for comparing the secondary output of a tested transformer structured as an electronic transformer with the secondary output of a standard transformer to measure a relative error ε and a phase angle θ of the secondary output of the tested transformer, with respect to the secondary output of the standard transformer. This transformer tester is equipped with a conversion circuit CT-OP1 for converting the secondary output of the standard transformer into a standard voltage, having a value within a prescribed range, a difference detection circuit VT-OP2 for picking up the difference voltage between an output voltage of the tested transformer and the standard voltage, and a digital operation circuit AU for performing digital conversion with the standard voltage and the difference voltage given thereto, to calculate the phase angle of the difference voltage with respect to the standard voltage.

COPYRIGHT: (C)2009,JPO&INPIT


Inventors:
Takuhiro Tsuchiyama
Kawagoe order
Application Number:
JP2007135543A
Publication Date:
September 07, 2011
Filing Date:
May 22, 2007
Export Citation:
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Assignee:
Nippon Electric Meter Test Center
International Classes:
G01R31/00; G01R25/00; G01R35/02
Domestic Patent References:
JP2004233083A
JP47004861B1
Attorney, Agent or Firm:
Kenji Yoshitake
Masami Tamama
Hidetoshi Tachibana
Yasukazu Sato
Hiroshi Yoshimoto
Yasushi Kawasaki