Title:
A test method and a device of an active antenna system radio frequency index
Document Type and Number:
Japanese Patent JP5947978
Kind Code:
B2
Abstract:
A method and apparatus for testing a radio frequency index of an active antenna system are provided. In the method, a tested active antenna system is placed in a test cover for performing radio frequency index testing, wherein, the test cover includes an antenna array part and a passive network part, and the antenna array part and the antenna feeder part of the tested active antenna system are the same. The method for testing includes: monomer calibration of the test cover; near-field coupling calibration; and radio frequency index testing. With the above-mentioned method and apparatus for testing the radio frequency index of the active antenna system, the radio frequency index of the active antenna system can be directly and effectively measured without need of adding an extra test interface.
Inventors:
One, Bomin
Lee, Shanlin
Khao, Chang Jiang
Han, Shanchi
Lee, Shanlin
Khao, Chang Jiang
Han, Shanchi
Application Number:
JP2015515387A
Publication Date:
July 06, 2016
Filing Date:
July 24, 2013
Export Citation:
Assignee:
ZTE CORPORATION
International Classes:
H04B17/12; G01R29/10; H01Q3/26; H01Q17/00; H01Q21/06; H04B17/21
Domestic Patent References:
JP62237365A | ||||
JP2005017241A | ||||
JP61172408A |
Foreign References:
WO2010131409A1 | ||||
WO2007112546A1 |
Attorney, Agent or Firm:
Yusuke Hiraki
Sekiya Mitsuo
Hidekazu Matsumaru
Sekiya Mitsuo
Hidekazu Matsumaru
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