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Title:
A three-dimensional shape measuring device, a three-dimensional shape measurement method, a program, a storage
Document Type and Number:
Japanese Patent JP6172904
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a three-dimensional shape measurement device which solves a problem that when performing measurement of a shape of a subject by projecting a pattern using a plurality of colors, measurement accuracy is greatly deteriorated depending on a color of a subject surface.SOLUTION: A three-dimensional shape measurement device includes: projection means for projecting a projection pattern on a subject; imaging means for picking up an image on which the projection pattern is projected; and three-dimensional shape calculation means for calculating, on the basis of the picked-up image picked up by the imaging means, a three-dimensional shape of the subject; wherein the projection means projects a projection pattern which repeats periodically, and besides which is obtained by superimposing a measurement wave form having continuous luminous change, and a code string having, in an area between peaks of the luminous value of the measurement waveform, at least two or more code symbols, obtained by coding binary or more information for performing mapping of the measurement waveform.

Inventors:
Sonoda Satoshi
Kenji Saito
Application Number:
JP2012195086A
Publication Date:
August 02, 2017
Filing Date:
September 05, 2012
Export Citation:
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Assignee:
Canon Inc
International Classes:
G01B11/25; G06T1/00
Domestic Patent References:
JP2000283739A
JP2008276743A
JP2011185872A
Attorney, Agent or Firm:
Takuma Abe
Sogo Kuroiwa