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Title:
AUTOMATIC TESTING DEVICE
Document Type and Number:
Japanese Patent JPH0730614
Kind Code:
A
Abstract:

PURPOSE: To provide the automatic testing device which can efficiently test the various functions of a rack constituting device.

CONSTITUTION: The automatic testing device for the rack constituting device mounted on a rack is provided with a first storage means 1 for storing the fixed data of a part to perform the set or control of the function part as test data provided for each kind of the function part and the parameter data of a part to specify the mounting position, second storage means 2 for storing an identification ID to specify test data (or the kind of the function part) as schedule data described corresponding to the mount state and address data to specify the mount position while relating them, and control part 3 for controlling the automatic test, and the control part 3 calls the correspondent test data from the first storage means 1 according to the identification ID in the second storage means 2 and executes the test while reloading the parameter data with the address data related to the identification ID in the second storage means 2.


Inventors:
OKAWA KIICHI
AISAKA SHIGETOSHI
Application Number:
JP15333893A
Publication Date:
January 31, 1995
Filing Date:
June 24, 1993
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
H04L69/40; (IPC1-7): H04L29/14
Attorney, Agent or Firm:
Teiichi