Title:
WIPING SAMPLE COLLECTION APPARATUS, CARD READER AND GATE APPARATUS
Document Type and Number:
Japanese Patent JP2018096982
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a wiping sample collection apparatus capable of achieving quick sample collection to each passenger and improving inspection efficiency and suitable for on-site quick inspection of human passage.SOLUTION: A wiping sample collection apparatus comprises: a wiping sample collection part including first and second wheels 1 and 2 rotated around rotary shafts, respectively, and a wiping conveyor 3 pulled by the first and second wheels 1 and 2 and moved between the first wheel and second wheels 1 and 2 by rotating the first and the second wheels 1 and 2; an analysis part arranged so as to analyze a sent sample. The wiping conveyor 3 wipes and collects the sample on the surface of an object 4 to be inspected sample. When the wiping conveyor 3 enters into the analysis part, the wiping conveyor is moved so that the analysis part can analyze the sample on the wiping conveyor 3 and passes the analysis part.SELECTED DRAWING: Figure 1
Inventors:
ZHANG QINGJUN
LI YUANJING
ZHAO ZIRAN
LI GE
MA QIUFENG
LI YUANJING
ZHAO ZIRAN
LI GE
MA QIUFENG
Application Number:
JP2017230594A
Publication Date:
June 21, 2018
Filing Date:
November 30, 2017
Export Citation:
Assignee:
UNIV QINGHUA
TONGFANG NUCTECH CO LTD
TONGFANG NUCTECH CO LTD
International Classes:
G01N1/04; G06K7/00
Domestic Patent References:
| JP2011237453A | 2011-11-24 | |||
| JP2004301749A | 2004-10-28 | |||
| JP2008064618A | 2008-03-21 | |||
| JPS6153738A | 1986-03-17 |
Foreign References:
| US20080264186A1 | 2008-10-30 | |||
| EP2793014A1 | 2014-10-22 |
Attorney, Agent or Firm:
Fukami patent office
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