SPECIFICATION

DETAILED DESCRIPTION OF INVENTION

At the last paragraph add the following paragraph:

The 360° All Around Turn X-Ray Diffractometer is to use computer software in individual 360° All Around Turn X-Ray Diffractometer as data handling process to record and analyze the recorded X-ray spectrums, and the individual 360° All Around Turn X-Ray Diffractometer sends the diffractometer usage safty data and recorded X-ray spectrums via internet access data handling process to the manufacturer's web site to use the manufacturer's software as data handling process to analyze the recorded X-ray spectrums. The detailed computer software compact disc listing is to be sent in later communications. The usage safty data is automatic sent, and the recorded X-ray spectrums sending is customer optional. The detailed diffractometer oprating process software, and the internet acess process software are to be copyright protected. The manufacturer's data handling process software are to be copyright protected. The traditional X- ray diffractometers are to use computer software to analyze recorded X-ray spectrums without influence from this patent as long as they do not use this patent pending software. But the traditional X-ray diffractometers are prohibited from using this patent pending computer monitor plate and software to record X-ray spectnims. The traditional X-ray diffractometers are prohibited from using internet access data handling process, and prohibited from sending the diffractometer safty usage data and the recorded X-ray spectnims via internet to their manufacturers' web site to use their manufacturer's software to analyze the recorded X-ray spectnims. The internet access process includes web browser and email. The traditional X-ray diffractometers are to send the recorded X-ray spectnims to data analyzing service companies without any influence from this pending patent

SPECIFICATION

TITLE OF THE INVETION

360° All Around Turn X-Ray Diflractometer

CROSS-REFERENCE TO RELATED APPLICATION

The 360° All Around Turn X-Ray Diffiactometer is the continuation application of Pending Patent Nonprovisional Patent The 360° All Around X-Ray Difrractometer, Application Number 61131221, Application Date June 7 ^th , 2008;

STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT t applicable.

REFERERENCE TO SEQUENCE LISTING, A TABLE, OR A COMPUTER PROGRAM LISTING COMPACT DISC APPENDIX

Sequence listing, table are not applicable. A computer program listing compact disc appendix is to be sent in the later communication.

BACKGROUND OF THE INVENTION

Not applicable. BRIEF SUMMARY OF THE INVENTION

This application is an improvement of current in use traditional X-ray diffractometers, and has new sample holders, new X-ray diffraction spectrums' recording systems, and new methods to analyze the recorded X-ray diffraction spectrum data. This new 360° All Around Turn X-ray diffractometer let samples turn around in X-rays 360° all around, and records the diffraction spectrums, unlike current in use traditional X-ray diffractometers that scan samples in limited less than 180° angles. The current in use X-ray diffractometer's spectrums do not allow the wave form analysis method as illustrated in Dr. Manly' s book "Wave Form Analysis" to decompose the complex wave forms into simple wave forms. To use the wave form analysis method the recorded wave form must have 360° or more angles' spectrums. More than 180° but less than 360° complex wave forms can only be incompletely decomposed, and thus the obtained simple wave forms are incomplete. The current in use traditional X-ray diffractometers only scan samples in less than 180° turn angles, thus the recorded X-ray diff action spectrums can not be separated into simple wave forms by using wave form analysis method. Accordingly it is very difficult to analyze the complex wave forms from current in use X-ray diffractometers, and to relate these spectrum data to sample

i

structures. In certain circumstances the recorded X-ray diffraction spectrum can not be explained.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWING

Figurel. Depicts the 360° All Around Turn X-ray Diffractometer scans samples when the sample holder is not turned. X-rays come out of X-ray source and go through the sample. Then the diffracted X-ray spectrums reach the plate, and are recorded.

Figure 2. Depicts the 360° All Around Turn X-ray Diffractometer scans samples when the sample holder is turned around from 0° to 360°. The X-rays come out of X-ray source and go through the sample. The diffracted X-rays pass through the slits and reach the recording systems that are put behind the slits. The recording systems are particles counter systems, or films. Figure 3. Depicts the film recording systems. At each electron's concentrated area of the plate, a slit is placed. Behind each slit a film is placed. The plate is put away from X-ray path. When the sample holder is turned around from 0° to 360°, the film goes from one rod to another rod, and records the X-ray diffraction spectrum. Each electron concentrated peak area is placed a slit and a film. Thus the sample X-ray diffraction spectrums are recorded.

Figure 4. Depicts the sample cuvet The sample cuvet is cubic. The cuvet 3 axises 1, m, n are equal.

Figure 4a. Depicts the lid of the cuvet is a little thinner. Thus the volume in the cuvet is larger to contain more samples.

Figure 4b. Depicts the lid of cuvet is a little thicker, and the volume in the cuvet is smaller to contain less sample.

DETAILED DESCRIPTION OF THE INVENTHON

The 360° All .Around Turn X-ray Diffractometer scans samples in 360° or more angles, let samples to be turned around in X-rays and records the samples' diffraction spectrum. The wave from analysis method can be used to decompose the recorded complex wave forms into simple wave forms, thus makes it feasible and easy to analyze the recorded X-ray diffraction spectrums. The 360° All Around Turn X-ray Diffractometer includes, but not limited to: single crystal X-ray diffractometer, powder X-ray diffractometer, and small angle X-ray diffractometer. The 360° All Around Turn X-ray Diffractometer contains X-ray source, cuvet, sample holder, plate, and spectrum recording systems. Unlike current in use traditional X-ray diffractometers, The 360° All Around Turn X-ray Diffractometer has the sample holder that can be turned around 360° in X-rays. In addition The 360° All Around Turn X-ray Diffractometer has additional recording systems. These additional recording systems are: plate to record the sample X-ray diffraction spectrums when the samples are scanned hi stable conditions. Then the slits are placed at the electrons concentrated area located at the X-ray diffraction spectrums on the plate. The plate is put away from the X-ray path. The particles counter systems are put behind the slits to allow the diffracted electrons to reach the counter systems. When the samples are turned around in X-rays, the counter systems count the reached dif&acted electrons and record them, thus record the 360° or more angles' scan X-ray diffraction spectrum. Another recording system is the film recording systems that are placed at the electrons concentrated areas located at the X-ray diffraction spectrum to record the reached diffracted electrons. When the samples are turned around, the films are turned and record the dif&acted electrons. These recorded X-ray diffraction spectrums record the samples' 360° or more angles turn X-ray diffraction spectrum.

When single crystals are scanned, samples are put in the cuvet. By selecting the thinner or thicker lid, the sample is put in the cuvet and placed tightly against the cuvet sides. The sample can not slide, or turned in the cuvet. The sample cuvet is put in sample holder in the direction such that the 1 axis side can be turned and scanned. Then the sample is turned, scanned, and the X-ray diffraction spectrums are recorded. The cuvet is brought out of the sample holder. The cuvet is turned in another direction and put in the sample holder. This time the m axis side is turned, scanned, and the X-ray diffraction spectrums are recorded. The cuvet is brought out of the sample holder. The cuvet is turned again in the third direction, and put in the sample holder. This time the n axis side is turned, scanned, and the X-ray diffraction spectrums are recorded. By analyzing all these 1, m, n axis sides' x-ray diffraction spectrums, the single crystal sample structure parameters are obtained.

When powder samples are scanned, only one cuvet axis side is turned, scanned, and the X-ray diffraction spectrums are recorded. The powder samples' 1 axis side, m axis side, and n axis side scan X-ray diffraction spectrums are same.

SPECIFICATION

DETAILED DESCRIPTION OF ₍ THE INVENTION

At the last paragraph add the following paragrapg:

Another way to scan crystal sample is: to piit X-ray source, sample holder, slit, and the particle counter

system at the same rod. The sample holder is kept stable, while the x-ray source, the slit, and the particle counter system are turned 360° with the rod. Thus record the sample X-ray diffraction complex wave forms.The recording system could also be the film recording system.. The films are located at thepe periphery of a circle centered at the sample holder. The ^j radius of the film to the sample holder is larger thanb the radius of the slit to sample holder. The X-ray source turned around 360°, while the sample holder is kept stable. The films at the periphery circle recorded s the sample x-ray diffraction complex wave forms.

SPECIFICATION

DETAILED DESCRIPTION OF THE INVENTION At the last paragraph add the following paragraphs:

This instrument machine specification includes the scanning crystal samples vertically, or tilted, that is to put the diff action spectrum plate vertically, and turn the sample cuvet around vertically. To tilt the plate and sample cuvet to scan, or scan vertically are going to have the same diffraction spectrums as to scan the sample in the process as described in the pages 1-3.

To enhence the ability of this instrument machine to seperate the complex X-ray wave forms to simple wave forms an U shape electromagnetic iron is placed at the two ends of the spectrum plate. High voltage is applied at the electromagnetic iron while scanning and recording the X-ray diff action spectrum.

SPECIFICATION

DETAILED DESCRIPTION OF INVENTION

After the last paragraph of the DETAILED DESCRIPTION OF INVENTION add the following paragraph:

The Computer Monitor Plate Record Systems include cell phone monitor plate. The cell phone monitor plate is placed at sample radiation record location, records the sample radiation spectrums and sends the spectrums to the data handling computer. Another way to use the cell phone in recording sample radiation spectrums is to use the cell phone camera function. The cell phone monitor plate is placed at sample side nearby location, a plate is placed at sample radiation recording location. The cell phone camera function is used to record the sample radiation spectrums and send the spectrums to the data handling computer.

The normal cell phone monitor plate size is a rectangle with the diagonal length about 2 inches long. Any size computer monitor plate, whether larger or smaller than cell phone monitor plate, as long as the computer monitor plate used the monitor plate record function to record the sample X-Ray radiation spectrums the computer monitor plate is within the scope of The 360° All Around Turn X-Ray Diffractometer. Supplemental Application Data Sheet

SPECIFICATION

Detailed Description of Invention

At the last pagraph add the following paragraphs:

The Computer monitor plate composition may vary. The layer composition could be amorphous silicon, combined with outlayer caesium iodiod, or gadolinium, and Si photodiode layer, and thin film transistors, or fiber coupled charge coupled device layer, then output to computer. The layer position could be amorphouse selenium, and thin film transistors, or active matrix array, or electrometer probes, or microplasma line addresssing. One more composition is barium fluorobromide doped with europium or casaesium bromide, and is scanned by a laser diode, and output by chaged coupled device array. Largely purified silicon is also used as a composition of the layer and output ampliphication by field effect transistor. Supplemental Application Data Sheet

SPECIFICATION

Detailed Description of Invention

At the last pagraph add the following paragraphs:

At the recoding plate place the ionization chamber, or guiger counter are used as recording deviee to record crystal sample diffraction spectrum and the output signal are connected to the data handling computer. This patent prohibit the traditional X-ray diffractometer from using the ionization chamber, or guiger counter as recording device and output the crystal sample diffraction spectrum to computer.

Supplemental Application Data Sheet

SPECIFICATION

Detailed Description of Invention

At the last pagraph add the following paragraphs:

At the receding plate place the semiconductor charge-coupled device, or complementary metal -oxide-semiconductor to record the crystal sample x-ray diffraction spectrums. The semiconductor charge-coupled device converts the x-ray radiation to voltage. It is an analog device. Additional circuits are used to change the analog voltage output to digital output. The output are sent to the computer to handle. Complementary metal -oxide- semiconductor converts the x-ray radiation to voltage. Additional circuits are used to change the voltage to digital output. The output are sent to the computer to handle. Complementary metal-oxide-semiconductor are used in cell phones. The semiconductor charge-coupled device and complementary metal-axide-semiconductor are combined to form a new detector to detect x-ray radiation. The output are connected to computer to porcess.

Supplemental Application Data Sheet

SPECIFICATION

Detailed Description of Invention

At the last pagraph add the following paragraphs:

The computer monitor plate recording systems, include cell phone monitor plate, are used in medical radiography image application. Various parts of patients body are placed in X-ray source and the computer monitor plate recording systems. Under x-ray radiation the bone and soft tissue have diffrenet absorption of the x-ray and have different immage. The computer monitor plate recording system record these images and the output are connected to computer to porcess. There are various medical radiography image applicaitons, such as: fluorotroscopy, pheumoencephalogrphy, dental radiograph, sialography, myelography, chest radiograph, abdominal x-ray, kidneys x-ray, dual- energy X-ray absorptiometry, gastrointestinal serries radiography, chplangiography, mammography, pyelogram, cystograph, anthrogram, hysterosalpingograph, skeletal survey, angiography, arotography, venography, lymphogram.

The computer monitor plate recording systems, include cell phone monitor plate, are used in industrial radiography testing application. X-ray source radiate x-rays and come thriough testing material, the computer monito plate recoring systems record the result radiontion image and the output are connected to computer to process. There are various industrial radiograph applicaitons, such as: nondestructive testing, material inspection, and weld inspeciton.