ABNORMAL DEVICE DISCRIMINATION DEVICE, METHOD, AND PROGRAM

WIPO Patent Application WO/2018/198210

A1

The present invention makes it possible to discriminate in which device an abnormality has occurred when the abnormality is detected in the combined waveform of a plurality of devices. An abnormal device discrimination device is provided with: a means for detecting an abnormal waveform from the combined waveform of a plurality of devices; a means for removing the abnormal waveform from the combined waveform; a means for separating the combined waveform from which the abnormal waveform is removed into the waveform of each device and identifying the state of said each device; a means for calculating the degree of coincidence between time during which said each device is in the on-state and time when the abnormal waveform has occurred; and a means for discriminating, on the basis of the degree of coincidence, a device in which an abnormality has occurred.

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KOUMOTO SHIGERU (JP)
SUZUKI RYOTA (JP)
PETLADWALA MURTUZA (JP)

PCT/JP2017/016446

November 01, 2018

April 25, 2017

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NEC CORP (JP)

H02J13/00

JP2012055100A	2012-03-15
JPH0965451A	1997-03-07
JP2007127554A	2007-05-24
JP2005004367A	2005-01-06

KATO, Asamichi (JP)

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