Title:
ABNORMALITY ANALYSIS METHOD, PROGRAM, AND SYSTEM
Document Type and Number:
WIPO Patent Application WO/2018/104985
Kind Code:
A1
Abstract:
The present invention provides an abnormality analysis method, program, and system which display the degrees of abnormality of sensor groups, each sensor group being set as one of a plurality of layers in a hierarchy, and which also facilitate the identification of the cause of the abnormality. An abnormality analysis system 100 according to an embodiment of the present invention is provided with: a group generation unit 120 which generates sensor groups, each being set as one of a plurality of layers in a hierarchy; a group abnormality degree calculation unit 130 which calculates the degree of abnormality of each group from values measured by the sensors in the group; and a display control unit 140 which performs control to display, as a function of time, the degree of abnormality of a group that is set as one of the plurality of layers in the hierarchy.
Inventors:
KAWAI TAKAZUMI (JP)
Application Number:
PCT/JP2016/005084
Publication Date:
June 14, 2018
Filing Date:
December 08, 2016
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G05B23/02
Foreign References:
| JP2011243118A | 2011-12-01 | |||
| JPS52142171A | 1977-11-26 | |||
| JP2013143009A | 2013-07-22 |
Attorney, Agent or Firm:
OKABE, Yuzuru et al. (JP)
Download PDF: