Title:
ABNORMALITY DETECTING METHOD, INFORMATION PROCESSING DEVICE, AND ABNORMALITY DETECTING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2020/027207
Kind Code:
A1
Abstract:
An abnormality detecting method according to one aspect of the present disclosure includes: a step (S10) of acquiring a plurality of items of time-series data obtained from a plurality of elements relating to the manufacture of a manufactured object, and attribute information for each of the plurality of items of time-series data; a step (S11) of analyzing correlations between the plurality of items of time-series data; a step (S12) of correcting the attribute information on the basis of the results of the analysis; a step (S13) of detecting an abnormality occurring in the plurality of elements, on the basis of the corrected attribute information and the plurality of items of time-series data; and a step (S14) of outputting information indicating the detected abnormality and the time at which the abnormality occurred.
Inventors:
OGURA TETSUYOSHI
MINEGISHI AKIRA
SASAKI YUKINORI
TAJIKA YOSUKE
MINEGISHI AKIRA
SASAKI YUKINORI
TAJIKA YOSUKE
Application Number:
PCT/JP2019/030043
Publication Date:
February 06, 2020
Filing Date:
July 31, 2019
Export Citation:
Assignee:
PANASONIC IP MAN CO LTD (JP)
International Classes:
G05B19/418; G05B23/02; G06Q50/04
Domestic Patent References:
| WO2011039823A1 | 2011-04-07 | |||
| WO2017164095A1 | 2017-09-28 |
Foreign References:
| JP2015088154A | 2015-05-07 | |||
| JPH09189579A | 1997-07-22 | |||
| JP2010501091A | 2010-01-14 | |||
| JP2012164109A | 2012-08-30 | |||
| JP2007148890A | 2007-06-14 |
Attorney, Agent or Firm:
NII, Hiromori et al. (JP)
Download PDF: