Title:
ABNORMALITY DETECTING METHOD AND ABNORMALITY DETECTING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2010/095314
Kind Code:
A1
Abstract:
(1) A compact set of learning data about normal cases is created using the similarities among data as key factors, (2) new data is added to the learning data according to the similarities and occurrence/nonoccurrence of an abnormality, (3) the alarm occurrence section of a facility is deleted from the learning data, (4) a model of the learning data updated at appropriate times made by the subspace method, and an abnormality candidate is detected on the basis of the distance between each piece of the observation data and a subspace, (5) analyses of event information are combined and an abnormality is detected from the abnormality candidates, and (6) the deviance of the observation data is determined on the basis of the distribution of frequencies of use of the learning data, and the abnormal element (sensor signal) indicated by the observation data is identified.
More Like This:
JP4632137 | Equipment diagnostic system |
Inventors:
MAEDA SHUNJI (JP)
SHIBUYA HISAE (JP)
SHIBUYA HISAE (JP)
Application Number:
PCT/JP2009/068566
Publication Date:
August 26, 2010
Filing Date:
October 29, 2009
Export Citation:
Assignee:
HITACHI LTD (JP)
MAEDA SHUNJI (JP)
SHIBUYA HISAE (JP)
MAEDA SHUNJI (JP)
SHIBUYA HISAE (JP)
International Classes:
G05B23/02
Foreign References:
JPH1074188A | 1998-03-17 | |||
JP2008040682A | 2008-02-21 | |||
JPH0954611A | 1997-02-25 | |||
JP2006309716A | 2006-11-09 | |||
JP2008282391A | 2008-11-20 | |||
JPH04238224A | 1992-08-26 | |||
JPH05256741A | 1993-10-05 |
Attorney, Agent or Firm:
Patent Corporate Body Dai-ichi Kokusai Tokkyo Jimusho (JP)
The first international patent firm of a patent business corporation (JP)
The first international patent firm of a patent business corporation (JP)
Download PDF: