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Patent Searching and Data


Title:
ABNORMALITY DETECTION APPARATUS AND ABNORMALITY DETECTION METHOD
Document Type and Number:
WIPO Patent Application WO/1997/042512
Kind Code:
A1
Abstract:
An abnormality detection apparatus includes a receiver (3; 3A; 3B) for receiving microwaves (2, 8) emitted from objects (1; 1A; 1B; 1C; 1D; 1E; 1F); a detector (4) connected to the receiver (3; 3A; 3B), for converting the microwaves (2, 8) to video signals (2S4; 2S21) and outputting them; and a signal processor (5) for converting the video signals (2S4; 2S21) outputted from the detector (4) to a display signal (2S5), outputting it to an external display device (91; 91A), evaluating the received microwaves (2, 8) for any abnormality on the basis of the duration time of the video signals (2S4; 2S21) and the level of the frequency and/or on the basis of the level of the video signal, and generating an alarm signal (2S6) when the microwaves are judged to be the result of abnormality.

Inventors:
OTANI HIROSHI (JP)
Application Number:
PCT/JP1996/001217
Publication Date:
November 13, 1997
Filing Date:
May 08, 1996
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP (JP)
OTANI HIROSHI (JP)
International Classes:
G01R31/02; G01R31/12; H02H1/00; H02H5/00; (IPC1-7): G01R31/02
Foreign References:
JPH04313074A1992-11-05
JPH06230066A1994-08-19
JPS60242347A1985-12-02
JPS5816572U1983-02-01
JPS5973776A1984-04-26
JPS5312071B21978-04-26
Other References:
See also references of EP 0838687A4
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