Title:
ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2019/012726
Kind Code:
A1
Abstract:
Embodiments of the present invention archieve highly accurate abnormality detection. According to one embodiment, an abnormality detection device includes a data acuqisitor, a performance index calculator, a performance index estimator, an abnormality degree ratio index generator, and an abnormality detector. The data acquisitor acquires measurement data. The performance index calculator calculates an actual value of a performance index from the measurement data. The performance index estimator acquires an estimated value of the performance index from the measurement data on the basis of a normal model learned in advance. The abnormality degree ratio index generator generates an abnormality degree ratio index that is an index indicating a residual between the actual value and the estimated value on the basis of a plurality of predetermined thresholds and an existence ratio of the residual having a value equal to or greater than each of the predetermined thresholds. The abnormality detector detects abnormality on the basis of the abnormality degree ratio index.
Inventors:
KIKUCHI GENTA (JP)
MARUCHI KOHEI (JP)
HATTORI YOHEI (JP)
MARUCHI KOHEI (JP)
HATTORI YOHEI (JP)
Application Number:
PCT/JP2018/005935
Publication Date:
January 17, 2019
Filing Date:
February 20, 2018
Export Citation:
Assignee:
TOSHIBA KK (JP)
International Classes:
B61L27/00; B61L15/00
Domestic Patent References:
| WO2016199210A1 | 2016-12-15 | |||
| WO1999006809A1 | 1999-02-11 |
Foreign References:
| US20170178426A1 | 2017-06-22 | |||
| EP2750041A1 | 2014-07-02 |
Other References:
None
Attorney, Agent or Firm:
NAGAI Hiroshi et al. (JP)
Download PDF: