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Title:
ABNORMALITY DETECTION DEVICE, METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/062609
Kind Code:
A1
Abstract:
An abnormality detection device according to one embodiment has: a measurement unit that measures, under set culture conditions, the culture state of a sample of a culture target that is being mass-cultured by a mass-culture device and that is fed to a microchannel chip and cultured; and a detection unit that detects abnormality of the culture state of the sample of the culture target by comparing an abnormality detection model that defines criteria for abnormality of the culture state, which indicates that the culture state of the sample of the culture target is different from usual, for each of a plurality of culture conditions with the culture state measured by the measurement unit and the set culture conditions for the sample.

Inventors:
ENDO NOBUAKI (JP)
TAKAYA KAZUHIRO (JP)
Application Number:
PCT/JP2022/035446
Publication Date:
March 28, 2024
Filing Date:
September 22, 2022
Export Citation:
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Assignee:
NIPPON TELEGRAPH & TELEPHONE (JP)
International Classes:
C12M1/34; G01N37/00
Domestic Patent References:
WO2021100191A12021-05-27
Foreign References:
JP2021508872A2021-03-11
JP2018141753A2018-09-13
Other References:
NUNES P. S., KJAERULFF S., DUFVA M., MOGENSEN K. B.: "Real-time direct cell concentration and viability determination using a fully automated microfluidic platform for standalone process monitoring", ANALYST, ROYAL SOCIETY OF CHEMISTRY, UK, vol. 140, no. 12, 1 January 2015 (2015-01-01), UK , pages 4007 - 4020, XP093148856, ISSN: 0003-2654, DOI: 10.1039/C5AN00478K
Attorney, Agent or Firm:
SUZUYE & SUZUYE (JP)
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