Title:
ABNORMALITY DETECTION DEVICE AND ABNORMALITY DETECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2016/035187
Kind Code:
A1
Abstract:
This abnormality detection device has: an apparatus having a drive unit; a first physical quantity detection means that detects a first state value relating to the apparatus when the drive unit is stopped; a second physical quantity detection means that detects a second state value relating to the apparatus when the drive unit is started; and a determining means that detects an abnormality of the apparatus. The determining means detects the abnormality of the apparatus on the basis of the first state value detected by means of the first physical quantity detection means, and the second state value detected by means of the second physical quantity detection means.
Inventors:
NAKAMURA TAKAHARU (JP)
SAITO MAKOTO (JP)
TOYOSHIMA MASAKI (JP)
SAITO MAKOTO (JP)
TOYOSHIMA MASAKI (JP)
Application Number:
PCT/JP2014/073350
Publication Date:
March 10, 2016
Filing Date:
September 04, 2014
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
F25B49/02; F24F11/02; F25B49/00
Foreign References:
| JPH10197031A | 1998-07-31 | |||
| JPH04177072A | 1992-06-24 | |||
| JP2005241089A | 2005-09-08 |
Attorney, Agent or Firm:
KISA PATENT & TRADEMARK FIRM (JP)
Patent business corporation きさ patent trademark office (JP)
Patent business corporation きさ patent trademark office (JP)
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