Title:
ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION PROGRAM, AND LEARNING DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/215336
Kind Code:
A1
Abstract:
An abnormality detection device 10 comprises: a process value acquisition unit that acquires a process value of a monitoring target apparatus 5, which is at least any one of a plurality of apparatus, during operation of a plant 3 including the plurality of apparatus; a command value acquisition unit that acquires a command value of a control operation amount for controlling the monitoring target apparatus 5; and an abnormality detection unit that detects an abnormality of the monitoring target apparatus 5 on the basis of a relationship between a variation range of the process value acquired by the process value acquisition unit in a predetermined period and a variation range of the command value acquired by the command value acquisition unit in the predetermined period.
Inventors:
MINETA YURIYA (JP)
OBATA TOMOYUKI (JP)
OBATA TOMOYUKI (JP)
Application Number:
PCT/JP2022/004017
Publication Date:
October 13, 2022
Filing Date:
February 02, 2022
Export Citation:
Assignee:
CHIYODA CORP (JP)
GRIDINC (JP)
GRIDINC (JP)
International Classes:
G05B23/02
Foreign References:
| JP2001202124A | 2001-07-27 | |||
| JP2011238148A | 2011-11-24 | |||
| JPH01205010A | 1989-08-17 | |||
| JP2002278621A | 2002-09-27 |
Attorney, Agent or Firm:
MIKI Tomoyoshi (JP)
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