Title:
ABNORMALITY DETECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/153268
Kind Code:
A1
Abstract:
An abnormality detection device (50) comprises: a temperature detection unit (25) that detects the temperature in a processing area of a machine tool, or a related temperature which is related to the temperature in the processing area; and a thermal abnormality determination unit (30) that, during a non-processing condition in which a processing operation of the machine tool is stopped, determines that a prescribed thermal abnormality has occurred in the machine tool if the detected temperature which was detected by the temperature detection unit (25) is greater than or equal to a preset threshold temperature, and determines that the prescribed thermal abnormality has not occurred if the detected temperature is less than the threshold temperature.
Inventors:
NISHIKAWA SHIZUO (JP)
TANAKA SHOTA (JP)
NAKAZAKI MASANOBU (JP)
OKOSHI KAZUYA (JP)
TANAKA SHOTA (JP)
NAKAZAKI MASANOBU (JP)
OKOSHI KAZUYA (JP)
Application Number:
PCT/JP2023/002993
Publication Date:
August 17, 2023
Filing Date:
January 31, 2023
Export Citation:
Assignee:
DMG MORI CO LTD (JP)
International Classes:
B23Q17/00; B23Q11/12; B23Q11/14
Domestic Patent References:
| WO2005092769A1 | 2005-10-06 |
Foreign References:
| JP2000263377A | 2000-09-26 |
Attorney, Agent or Firm:
MURAKAMI, Satoshi (JP)
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