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Patent Searching and Data


Title:
ABNORMALITY DETECTION AND PROTECTION CIRCUIT
Document Type and Number:
WIPO Patent Application WO/2014/132571
Kind Code:
A1
Abstract:
An abnormality detection and protection circuit (10a-10c, 31), wherein an overheat sensing unit (4a-4c) is provided for each of a plurality of communication channels on an IC chip, and senses, as a sensed temperature, the temperature of each of the communication channels. A chip temperature sensing unit (5) senses, as a reference temperature, the temperature of an arbitrarily defined region on the IC chip. A detection unit (11a-11c, 32) sets, as a threshold value, the value of a predetermined percentage of the difference between an overheat protection temperature and the reference temperature for each of the communication channels on the basis of the sensed temperature of each of the communication channels and the reference temperature, and when the sensed temperature exceeds the threshold value, specifies that this communication channel is in a state before overheat is sensed. When the detection unit specifies that one communication channel among the plurality of communication channels is in the state before overheat is sensed and specifies that the one communication channel is in an overcurrent state, a stop control unit (20a-20c, 40) stops the output of the one communication channel.

Inventors:
NAGATOMO HIDEHARU (JP)
SUZUKI AKIRA (JP)
Application Number:
PCT/JP2014/000634
Publication Date:
September 04, 2014
Filing Date:
February 06, 2014
Export Citation:
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Assignee:
DENSO CORP (JP)
International Classes:
H02H5/04
Foreign References:
JP2012095117A2012-05-17
JP2012210005A2012-10-25
Attorney, Agent or Firm:
KIN, Junhi (JP)
Gold Junki (JP)
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