Title:
ABNORMALITY DETECTION SYSTEM, ABNORMALITY DETECTION METHOD, AND COMPUTER-READABLE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2022/054158
Kind Code:
A1
Abstract:
This abnormality detection system comprises a shape data acquisition means for acquiring shape data on a surface of a structure, a reference shape calculation means for calculating a reference shape for the shape data acquired by the shape data acquisition means, an abnormality candidate extraction means for extracting abnormality candidate areas of the surface on the basis of a difference between the reference shape calculated by the reference shape calculation means and the shape data corresponding to the reference shape, a roughness calculation means for calculating roughness of each of the abnormality candidate areas extracted by the abnormality candidate extraction means and areas in the vicinity of the abnormality candidate areas, and an abnormality determination means for determining that an abnormality candidate area that is of the abnormality candidate areas extracted by the abnormality candidate extraction means and has roughness calculated by the roughness calculation means exceeding a threshold is abnormal.
Inventors:
TSUJI AKIRA (JP)
Application Number:
PCT/JP2020/034058
Publication Date:
March 17, 2022
Filing Date:
September 09, 2020
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G01B21/20; G01B21/30; G01B21/32
Foreign References:
| JP2019117188A | 2019-07-18 | |||
| JP2017162452A | 2017-09-14 | |||
| JP2015031018A | 2015-02-16 |
Attorney, Agent or Firm:
IEIRI Takeshi (JP)
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