Title:
ABNORMALITY DETECTION SYSTEM, ABNORMALITY DETECTION METHOD, AND COMPUTER-READABLE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2022/054163
Kind Code:
A1
Abstract:
This abnormality detection system comprises a shape data acquisition means for acquiring shape data on surfaces of a structure, a surface direction calculation means for calculating directions toward which the surfaces face on the basis of the shape data acquired by the shape data acquisition means, a shape data division means for dividing the shape data on the basis of the directions of the surfaces calculated by the surface direction calculation means, a reference shape calculation means for calculating a reference shape for each piece of the shape data divided by the shape data division means, and an abnormality detection means for detecting an abnormality in the surface of the structure on the basis of a difference between each piece of the shape data divided by the shape data division means and the reference shape which corresponds to each piece of the shape data and is calculated by the reference shape calculation means.
Inventors:
TSUJI AKIRA (JP)
Application Number:
PCT/JP2020/034083
Publication Date:
March 17, 2022
Filing Date:
September 09, 2020
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G01B21/20; G01B21/32
Foreign References:
| JP2019117188A | 2019-07-18 | |||
| JP2018071973A | 2018-05-10 | |||
| JP2017162452A | 2017-09-14 |
Attorney, Agent or Firm:
IEIRI Takeshi (JP)
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