Title:
ABNORMALITY DETECTION SYSTEM FOR SECONDARY CELLS AND ABNORMALITY DETECTION METHOD FOR SECONDARY CELLS
Document Type and Number:
WIPO Patent Application WO/2019/053557
Kind Code:
A1
Abstract:
Provided is an abnormality detection system for secondary cells that detects the remaining power in secondary cells for an electric vehicle, and acts to report or terminate the use of a secondary cell demonstrating abnormal characteristics, replace the secondary cell, or change the charging conditions. Specifically provided is an abnormality detection system in which detection is performed by comparing a value obtained by estimating, on the basis of measurement values for the current and voltage of a secondary cell, the internal resistance or the SOC of the secondary cell using a non-linear Kalman filter and a value obtained by inputting the estimated value into an AI abnormality detection system (network) and predicting the change to the internal resistance, and deeming cases in which the difference between said values is large to be abnormalities.
Inventors:
ISA TOSHIYUKI (JP)
KUSUNOKI KOJI (JP)
CHIDA AKIHIRO (JP)
TOYOTAKA KOUHEI (JP)
TAJIMA RYOTA (JP)
KUSUNOKI KOJI (JP)
CHIDA AKIHIRO (JP)
TOYOTAKA KOUHEI (JP)
TAJIMA RYOTA (JP)
Application Number:
PCT/IB2018/056755
Publication Date:
March 21, 2019
Filing Date:
September 05, 2018
Export Citation:
Assignee:
SEMICONDUCTOR ENERGY LAB (JP)
International Classes:
G01R31/36; H01M10/42; H01M10/48; H02J7/00
Domestic Patent References:
| WO2016129248A1 | 2016-08-18 |
Foreign References:
| US8855954B1 | 2014-10-07 | |||
| JP2007187534A | 2007-07-26 |
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