Title:
ABNORMALITY DETERMINATION DEVICE, ABNORMALITY DETECTION DEVICE, ABNORMALITY DETERMINATION METHOD, AND ABNORMALITY DETERMINATION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/175933
Kind Code:
A1
Abstract:
In order to enable highly accurate abnormality determination for determination targets, this abnormality determination device (1) comprises: an acquisition unit (11) that acquires measurement data for gas generated from a determination target, from a plurality of gas sensors having different reactivities depending on the composition of the gas; and a determination unit (12) that determines an abnormality related to the determination target by comparing reference data with determination data that is obtained from the measurement data of each of the plurality of gas sensors for the determination target, and obtained in accordance with a relationship between the measurement data.
Inventors:
TONOUCHI NORIYUKI (JP)
Application Number:
PCT/JP2022/012707
Publication Date:
September 21, 2023
Filing Date:
March 18, 2022
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G01N5/02
Domestic Patent References:
| WO2017122338A1 | 2017-07-20 |
Foreign References:
| JPH05312708A | 1993-11-22 | |||
| JP2021196747A | 2021-12-27 | |||
| JPH05223720A | 1993-08-31 |
Attorney, Agent or Firm:
HARAKENZO WORLD PATENT & TRADEMARK (JP)
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