Title:
ABNORMALITY DETERMINATION DEVICE, ABNORMALITY DETERMINATION METHOD, AND ABNORMALITY DETERMINATION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2018/220663
Kind Code:
A1
Abstract:
Provided is an abnormality determination device in which a fault diagnosis unit (144) acquires a control value for controlling an actuator (20) from each of a first processing circuit (11) and a second processing circuit (12) that are duplicate processing circuits. When a first control value acquired from the first processing circuit (11) and a second control value acquired from the second processing circuit (12) do not match, the fault diagnosis unit (144) performs comparison between at least one of the first control value and the second control value and a state normal range that is a normal value range for the control values estimated from the current operating state of a host system in which the actuator (20) is included and determines whether abnormality is occurring in either the first processing circuit (11) or the second processing circuit (12).
Inventors:
OMORI YASUHIRO (JP)
ISHIKAWA HIROAKI (JP)
ISHIKAWA HIROAKI (JP)
Application Number:
PCT/JP2017/019842
Publication Date:
December 06, 2018
Filing Date:
May 29, 2017
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
B60W50/023; B60R16/02; G06F11/20
Domestic Patent References:
| WO2015125617A1 | 2015-08-27 |
Foreign References:
| JP2012126162A | 2012-07-05 | |||
| JPS6015704A | 1985-01-26 | |||
| JP2016512483A | 2016-04-28 |
Attorney, Agent or Firm:
MIZOI INTERNATIONAL PATENT FIRM (JP)
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