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Title:
ABNORMALITY DETERMINATION DEVICE AND ABNORMALITY DETERMINATION METHOD
Document Type and Number:
WIPO Patent Application WO/2020/157820
Kind Code:
A1
Abstract:
In this abnormality determination device, a measurement value acquisition unit (10) acquires measurement values that are larger than the measurement values directly prior thereto from vibration measurement values measured sequentially at the time of machining operation of a machine tool (2), replaces measurement values equal to or less than the measurement values directly prior thereto with the measurement values directly prior thereto, and thereby acquires measurement value time series data. A data generation unit (11) generates data in which a plurality of pieces of measurement value time series data are linked. An abnormality determination unit (12) determines abnormality of the machine tool (2) on the basis of the data generated by the data generation unit (11).

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Inventors:
SHINOHARA SHINJI (JP)
ISHIGAMI SHINYA (JP)
Application Number:
PCT/JP2019/002890
Publication Date:
August 06, 2020
Filing Date:
January 29, 2019
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC ENG COMPANYLIMITED (JP)
International Classes:
B23Q17/09; B23Q17/12; G05B19/18; G05B19/4065
Foreign References:
JP2018012164A2018-01-25
JP2000084798A2000-03-28
JPH1128647A1999-02-02
JPH068111A1994-01-18
Attorney, Agent or Firm:
TAZAWA, Hideaki et al. (JP)
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