Title:
ABNORMALITY DETERMINING METHOD, AND PRODUCTION CONTROL SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/140195
Kind Code:
A1
Abstract:
This abnormality determining method, for a production control system for controlling a production line including a first production device, a second production device and a third production device, includes: acquiring at least first operation status data for the first production device and third operation status data for the third production device, among the first operation status data, second operation status data for the second production device, and the third operation status data (S11); if it is determined that the second operation status data have not been acquired (No in S13), predicting a dummy operating time corresponding to a planned production quantity for the second production device, and generating dummy operation status data including the planned production quantity and the dummy operating time (S14); performing abnormality determination processing for an overall production process on the basis of the first operation status data, the third operation status data, and the dummy operation status data (S16); and outputting determination result information indicating the result of the abnormality determination processing so as to be displayed on a display device included in the production control system (S19).
Inventors:
SHIMAZAKI YUTA
MINEGISHI AKIRA
MINEGISHI AKIRA
Application Number:
PCT/JP2023/000843
Publication Date:
July 27, 2023
Filing Date:
January 13, 2023
Export Citation:
Assignee:
PANASONIC IP MAN CO LTD (JP)
International Classes:
G05B19/418
Foreign References:
| JP2018185610A | 2018-11-22 | |||
| JP2005032030A | 2005-02-03 | |||
| JPH10175132A | 1998-06-30 |
Attorney, Agent or Firm:
NII, Hiromori et al. (JP)
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