Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
ABNORMALITY DIAGNOSIS DEVICE AND ABNORMALITY DIAGNOSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2006/030786
Kind Code:
A1
Abstract:
An abnormality diagnosis device used for a machine apparatus having a part rotating and sliding relative to a stationary member is provided with a detection section (31) and a signal processing section (81). The detection section (31) is fixed to the part rotating or sliding or to the stationary member and has a vibration sensor (32) and a temperature sensor (33). The signal processing section (81) determines the condition of the part based on a signal detected and outputted by the detection section (31). The signal processing section (81) determines whether there is an abnormality in the part, or whether there is an abnormality in the part and the degree of damage of the part.

Inventors:
MIYASAKA TAKANORI
MUTOH YASUSHI
SAHARA JUNTARO
Application Number:
PCT/JP2005/016845
Publication Date:
March 23, 2006
Filing Date:
September 13, 2005
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
NSK LTD (JP)
MIYASAKA TAKANORI
MUTOH YASUSHI
SAHARA JUNTARO
International Classes:
F16C19/52; G01H17/00; G01M13/04; G01M99/00
Foreign References:
JP2004184400A2004-07-02
JP2004093256A2004-03-25
JP2004150974A2004-05-27
JP2003202276A2003-07-18
JP2002022617A2002-01-23
JPH09113416A1997-05-02
JPH09500452A1997-01-14
Attorney, Agent or Firm:
Oguri, Shohei (7-13 Nishi-Shimbashi 1-chom, Minato-ku Tokyo 03, JP)
Download PDF: