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Patent Searching and Data


Title:
ABNORMALITY DIAGNOSIS SYSTEM
Document Type and Number:
WIPO Patent Application WO/2017/159016
Kind Code:
A1
Abstract:
Provided is an abnormality diagnosis system with which it is possible to express the propagation relationship of effects among areas, and to easily determine the area that is the factor causing a state that differs from normal operation, even when there is an extremely large number of devices in a facility. The present invention has a state change detection means that has a plurality of detection units set for each area of a facility and that detects state changes from changes in the relationship of a plurality of operation data items pertaining to the areas monitored by the detection units. The area that is the cause of a state change at the facility is estimated on the basis of the state change detection results of the detection units of the state change detection means, and on the basis of information about the relationships between the detection units, the information containing the propagation relationship of effects among the areas of the facility that correspond to the detection units.

Inventors:
KAGEYAMA KOUJI (JP)
Application Number:
PCT/JP2017/000919
Publication Date:
September 21, 2017
Filing Date:
January 13, 2017
Export Citation:
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Assignee:
HITACHI LTD (JP)
International Classes:
G05B23/02
Foreign References:
JP4430384B22010-03-10
JPS63316216A1988-12-23
JPH08234832A1996-09-13
JP2000214924A2000-08-04
JP2007193457A2007-08-02
Attorney, Agent or Firm:
TODA Yuji (JP)
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