Title:
ABNORMALITY DIAGNOSIS SYSTEM
Document Type and Number:
WIPO Patent Application WO/2018/154703
Kind Code:
A1
Abstract:
With a conventional diagnostic device, the processing content was fixed, and if a diagnosis target or diagnosis sensor changed, it was necessary to recreate a diagnostic device for the new diagnosis target or diagnosis sensor. In addition, there was a problem in that, if a new diagnostic algorithm was developed, it was not possible to compare the superiority or the like against the algorithm being used up to that point. Thus, the present invention is configured as follows. Provided is an abnormality diagnosis system that detects a failure sign of a device to be diagnosed, the abnormality diagnosis system comprising: a diagnosis process search unit which searches for a suitable diagnosis processing procedure by comparing a plurality of diagnosis processing procedures, and outputs reconfiguration information corresponding to the suitable diagnosis processing procedure; and a diagnosis processing unit which has a reconfigurable processing unit and which uses the suitable diagnosis processing procedure found by the diagnosis process search unit to detect a failure sign of the device to be diagnosed by reconfiguring the processing unit on the basis of the reconfiguration information.
Inventors:
UNUMA MUNETOSHI (JP)
FUJIWARA JUNSUKE (JP)
FUJIWARA JUNSUKE (JP)
Application Number:
PCT/JP2017/007080
Publication Date:
August 30, 2018
Filing Date:
February 24, 2017
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G05B23/02
Foreign References:
| JP2015203936A | 2015-11-16 | |||
| JP2007257190A | 2007-10-04 |
Attorney, Agent or Firm:
POLAIRE I.P.C. (JP)
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