Title:
ABNORMALITY DIAGNOSTIC DEVICE, ABNORMALITY DIAGNOSTIC SYSTEM, AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2023/089773
Kind Code:
A9
Abstract:
This abnormality diagnostic device for diagnosing an abnormality that occurs in a factory acquires data to be used for detecting an abnormality that occurs in a factory, detects an abnormality of a subject of diagnosis by using the data to be used for detecting an abnormality, reports the detected abnormality, acquires data to be used for analyzing an abnormality, and analyzes a candidate abnormality cause by using the data to be used for analyzing an abnormality in a period including a time point at which the abnormality has occurred, or by using the data to be used for analyzing an abnormality and the data to be used for detecting an abnormality in a period including a time point at which the abnormality has been detected.
Inventors:
HU LIANCHENG (JP)
SATOU KAZUHIRO (JP)
SATOU KAZUHIRO (JP)
Application Number:
PCT/JP2021/042610
Publication Date:
March 07, 2024
Filing Date:
November 19, 2021
Export Citation:
Assignee:
FANUC CORP (JP)
International Classes:
G05B23/02
Attorney, Agent or Firm:
AIWA INTERNATIONAL PATENT AGENCY (JP)
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