ABNORMALITY SIGN DETECTION DEVICE, ABNORMALITY SIGN DETECTION METHOD, AND ABNORMALITY SIGN DETECTION PROGRAM

Title:

ABNORMALITY SIGN DETECTION DEVICE, ABNORMALITY SIGN DETECTION METHOD, AND ABNORMALITY SIGN DETECTION PROGRAM

Document Type and Number:

WIPO Patent Application WO/2020/245968

Kind Code:

A1

Abstract:

This abnormality sign detection device (100) comprises: an abnormality degree calculation unit (106) that calculates an abnormality degree of partial time-series data on the basis of a feature amount of the partial time-series data that is at least a portion of time-series data; an abnormality sign determination unit (108) that determines, as abnormality sign data, the partial time-series data when the abnormality degree of the partial time-series data exceeds a threshold value; and a normality determination unit (110) that calculates the reliability of abnormality sign data on the basis of feature data corresponding to a feature amount of the abnormality sign data, and determines, as normal data, the abnormality sign data when the reliability cannot be permitted.

Inventors:

TAKADA YOSHINORI (JP)
KUWAJIMA KOHEI (JP)

Application Number:

PCT/JP2019/022495

Publication Date:

December 10, 2020

Filing Date:

June 06, 2019

Export Citation:

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Assignee:

MITSUBISHI ELECTRIC CORP (JP)

International Classes:

G05B23/02

Foreign References:

JP2009259020A	2009-11-05
JP2006163517A	2006-06-22
JP2019067136A	2019-04-25
JP2017097712A	2017-06-01