Title:
ACCURACY MANAGEMENT SYSTEM
Document Type and Number:
WIPO Patent Application WO/2012/011371
Kind Code:
A1
Abstract:
In a clinical examination room, since the operating situation of an automatic analysis device, an additional examination item, etc. may constantly vary the degree of contamination at the device, calibration executed at conventional intervals has a risk of not being capable of maintaining the sufficient performance of the device. Furthermore, since the performance of unsealed reagent also varies the result of precision management, calibration at predetermined intervals has a risk of not being capable of flexibly calibrating the reagent when the performance of the reagent is varied due to replenished reagent or contamination. Provided is a precision management method which gives a warning about an optimum calibration method and optimum calibration intervals on the basis of a precision management screen and variation patterns in calibration results.
Inventors:
LI Qing (HITACHI HIGH-TECHNOLOGIES CORPORATION 882, Oaza Ichige, Hitachinaka-sh, Ibaraki 04, 〒3128504, JP)
李 晴 (〒04 茨城県ひたちなか市大字市毛８８２番地 株式会社日立ハイテクノロジーズ 那珂事業所内 Ibaraki, 〒3128504, JP)
李 晴 (〒04 茨城県ひたちなか市大字市毛８８２番地 株式会社日立ハイテクノロジーズ 那珂事業所内 Ibaraki, 〒3128504, JP)
Application Number:
JP2011/065023
Publication Date:
January 26, 2012
Filing Date:
June 30, 2011
Export Citation:
Assignee:
HITACHI HIGH-TECHNOLOGIES CORPORATION (24-14, Nishi Shimbashi 1-chome Minato-k, Tokyo 17, 〒1058717, JP)
株式会社日立ハイテクノロジーズ (〒17 東京都港区西新橋一丁目２４番１４号 Tokyo, 〒1058717, JP)
LI Qing (HITACHI HIGH-TECHNOLOGIES CORPORATION 882, Oaza Ichige, Hitachinaka-sh, Ibaraki 04, 〒3128504, JP)
株式会社日立ハイテクノロジーズ (〒17 東京都港区西新橋一丁目２４番１４号 Tokyo, 〒1058717, JP)
LI Qing (HITACHI HIGH-TECHNOLOGIES CORPORATION 882, Oaza Ichige, Hitachinaka-sh, Ibaraki 04, 〒3128504, JP)
International Classes:
G01N35/00
Attorney, Agent or Firm:
KASUGA Yuzuru (Torii-nihonbashi Bldg, 4-1 Nihonbashi-honcho 3-chome, Chuo-k, Tokyo 23, 〒1030023, JP)
Claims: