Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
ACTIVE LIGHT–SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTIVE LIGHT–SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMATION METHOD, AND PRODUCTION METHOD FOR ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/145564
Kind Code:
A1
Abstract:
The present invention provides an active light–sensitive or radiation-sensitive resin composition that includes (A) a resin that is degraded and increases in polarity under the action of acid and (C) a compound that generates an acid as a result of being irradiated with active light or radiation, the compound being an ionic compound that has an anion portion that is represented by a specific general formula (I), and the HOMO of the acid being at least -6.50 eV. The present invention also provides an active light–sensitive or radiation-sensitive film, a pattern formation method, a production method for an electronic device, and a compound that use the active light–sensitive or radiation-sensitive resin composition.

Inventors:
MIYOSHI TARO (JP)
YAMAGUCHI SHUHEI (JP)
MOTOYAMA HIROKI (JP)
Application Number:
PCT/JP2023/001305
Publication Date:
August 03, 2023
Filing Date:
January 18, 2023
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
FUJIFILM CORP (JP)
International Classes:
G03F7/004; C07D409/04; C07D495/04; C08F212/14; C08F220/26; G03F7/038; G03F7/039; G03F7/20
Foreign References:
JP2021081678A2021-05-27
JP2015131777A2015-07-23
JP2013200560A2013-10-03
Attorney, Agent or Firm:
KOH-EI, P.C. (JP)
Download PDF: