ADJUSTABLE PINHOLE

WIPO Patent Application WO/2004/104647

A1

The invention relates to an adjustable pinhole, especially for the illumination beam path and/or detection beam path of a laser scanning microscope. Said pinhole consists of at least two planar basic components comprising articulation points in the form of connecting elements, to which at least one cutting edge that can be displaced in one direction is applied. The basic components advantageously contain at least one integrated preferably optical or electromagnetic positioning element, and a device for preferably optical or electromagnetic position detection is provided on the blade or is connected to the same. The inventive pinhole is advantageously provided with two asymmetric openings oriented in opposite directions for the optical position detection and at least one light source radiates through said openings. A gap which is oriented preferably perpendicularly in relation to the direction of displacement is provided upstream or downstream of the openings and the quantity of light radiated through the gap is detected separately for each opening.

LASSER THEO (CH)
LOPEZ ANTONIO (CH)
SIDLER THOMAS (CH)
FAVRE SEBASTIAN (CH)
GIANOTTI RONALD (CH)

PCT/EP2004/004498

December 02, 2004

April 28, 2004

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ZEISS CARL JENA GMBH (DE)
LASSER THEO (CH)
LOPEZ ANTONIO (CH)
SIDLER THOMAS (CH)
FAVRE SEBASTIAN (CH)
GIANOTTI RONALD (CH)

G01J3/04; G02B5/00; G03B9/06; (IPC1-7): G02B5/00; G01J3/04; G03B9/06

EP0280375A1	1988-08-31
US5206765A	1993-04-27
US4047808A	1977-09-13

PATENT ABSTRACTS OF JAPAN vol. 1997, no. 10 31 October 1997 (1997-10-31)

CARL ZEISS JENA GMBH (Holger Carl Zeiss-Promenade 10, Jena, DE)

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